The Stanford Research SR200 Gate Scanner automates waveform recovery for SR250 and SR255 Gated Integrator and Boxcar Averager modules. It drives an adjustable ramp voltage to the external gate delay control inputs, enabling systematic scanning of the gate position across time-varying signals. This approach facilitates precise characterization of signal dynamics and temporal behavior without manual adjustment.
– Technical Specifications
• Ramp voltage output: 0 to 10 V for X-axis synchronization
• Scan time range: 10 milliseconds to 5 minutes (selectable)
• Scan modes: single or repeated
• Scan direction: forward and reverse
• Variable scan width control
• Pen lift output included
– Key Features
• Configurable initial and final gate delays for custom scan windows
• X-axis ramp output (0–10 V) for driving external chart recorders or oscilloscopes
• Forward/reverse scan direction selection
• Continuous or single-shot scan operation
• Flexible scan timing from 10 ms to 5 minutes accommodates both fast transients and slow phenomena
– Typical Applications
The SR200 is essential for time-resolved spectroscopy, boxcar averaging measurements, and characterization of pulsed or periodic signals where gate position variation reveals signal structure across the temporal window. Synchronized X-axis output enables real-time waveform visualization and simultaneous multi-channel data recording.
– Compatibility & Integration
The SR200 Gate Scanner is designed exclusively for use with Stanford Research SR250 Gated Integrator and SR255 Fast Sampler modules. It connects via the external gate delay control inputs on these instruments, forming an integrated analysis system for advanced signal recovery.
