Tektronix 11801

The Tektronix 11801 is a high-performance digital sampling oscilloscope engineered for precise characterization of high-speed signals in telecommunications, data storage, digital design, and semiconductor testing. Its modular architecture supports up to 136 channels and accepts multiple dual-channel sampling heads, enabling flexible configuration for diverse measurement requirements. The instrument delivers DC to 50 GHz bandwidth with 7 ps rise time and incorporates advanced waveform processing, TDR capability, and automated measurement functions.

– Technical Specifications

Bandwidth & Sampling
• Bandwidth: DC to 50 GHz
• Rise Time: 7 ps
• Maximum Sample Rate: 200 kS/s
• Sampling Interval: 10 femtoseconds (0.01 ps)
• Record Length: 512, 1024, 2048, 4096, or 5120 samples

Vertical System
• Resolution: 8 bits (25 points/div)
• Input Sensitivity: 2 to 255 mV/div in 1 mV/div steps
• Offset Range: ±2 V
• Amplifier Gain Accuracy: ±1%

Trigger System
• Trigger Bandwidth: 3 GHz
• Trigger Sensitivity: 100 mV (DC/AC, 1X ≤3 GHz); 1 V (DC/AC, 10X <3 GHz)
• Jitter: 1.3 ps + 4 ppm of position (typical)

Time Base
• Range: 1 ps/div to 5 ms/div
• Time Interval Accuracy: 8 ps + 0.01% × (interval) + 0.001% × (position), guaranteed

– Key Features

• Modular architecture: base 8 channels, expandable to 136 channels via SM-11 Multi-Channel Unit
• Multiple sampling head options: SD-14 (2.5 GHz), SD-20/26 (20 GHz), SD-22 (12.5 GHz), SD-24/30/32 (20/40/50 GHz), SD-42/44/46 (optical conversion with 55/22 ps response)
• Waveform processing: add, subtract, multiply, divide, differentiate, integrate, envelope, filter, and statistical functions
• Automated measurements: max, min, peak-to-peak, RMS, rise time, extinction ratio, overshoot, undershoot, noise

– Typical Applications

Telecommunications signal analysis, high-speed digital design verification, optical-to-electrical conversion characterization, TDR/reflectometry, and semiconductor device testing.

– Compatibility & Integration

Accepts up to four dual-channel sampling heads. Supports SD-series probe samplers and O/E converters for extended measurement bandwidth and optical signal analysis.