Tektronix 11801B

The Tektronix 11801B is a high-performance digital sampling oscilloscope mainframe engineered for demanding high-speed electronic measurements up to 50 GHz. Its modular architecture supports flexible configuration with plug-in sampling heads, accommodating applications from semiconductor testing to TDR characterization of circuit boards, IC packages, and cables. The mainframe provides 8 input channels, expandable to 136 channels with SM-11 Multi-Channel Units.

– Technical Specifications

Bandwidth & Timing
• DC to 50 GHz bandwidth
• Rise time: 7 ps
• Sampling interval: 10 fs (0.01 ps)
• Maximum sample rate: 200 kS/s
• Time base range: 1 ps/div to 5 ms/div (main and window)
• Record length options: 512, 1024, 2048, 4096, 5120 samples

Vertical System
• Resolution: 8-bit full screen (78 µV/LSB at 2 mV/div)
• Gain accuracy: ±1% of all settings
• Deflection factors: 2 to 255 mV/div in 1 mV/div increments
• Offset range: ±2 V

Trigger System
• Bandwidth: 3 GHz
• Sensitivity (DC, 1X ≤3 GHz): 100 mV
• Sensitivity (AC, 1X 300 kHz to 3 GHz): 100 mV
• Sensitivity (DC, 10X ≤3 GHz): 1 V
• Trigger level range: ±1.0 V (±10 V with 10X attenuator)
• Delay jitter: 1.3 ps + 4 ppm typical; 2.0 ps + 5 ppm maximum (RMS)
• Holdoff: 5 µs to 2.5 seconds
• Internal clock: 100 kHz

TDR System (SD-24 Module)
• Reflected rise time: 35 ps or less
• Step amplitude: Adjustable to ±250 mV
• Time coincidence between TDR steps: Less than 1 ps

Display
• 9-inch diagonal CRT with magnetic deflection
• 552 × 704 displayed pixels
• Eight-color default set; user-selectable from 262,144-color palette

Power & Environment
• Line voltage: 90 to 132 V RMS, 180 to 250 V RMS
• Line frequency: 48 to 440 Hz
• Maximum power: 214 W
• Operating temperature: 0°C to +50°C
• Storage temperature: -40°C to +75°C
• Humidity: Up to 95% RH to 50°C
• EMC: MIL-STD-461B, FCC Part 15 Class A, VDE 0871/6.78 Class B
• Safety: UL 1244, CSA Bulletin 556B

– Key Features

• Sub-10 picosecond sampling interval enables precise transient capture
• Modular plug-in architecture for custom channel configurations
• Eight-color CRT display with extensive color palette customization
• Trigger jitter <2 ps RMS maximizes timing measurement accuracy
• TDR step adjustment <1 ps time coincidence for impedance characterization

– Typical Applications

• High-speed semiconductor device characterization
• Transmission line and interconnect TDR measurements
• IC package and cable impedance analysis
• Transient signal acquisition requiring sub-nanosecond resolution

– Compatibility & Integration

The 11801B accepts SD-series sampling heads for application-specific measurement capability. External trigger inputs support 23 ns pre-trigger observation (45.5 ns with Option 1M) via DL 11 delay lines. Multi-channel expansion via SM-11 units scales the instrument to 136 simultaneous channels.