The Tektronix TDS580C is a 1 GHz digitizing oscilloscope engineered for high-speed signal acquisition, analysis, and troubleshooting in signal integrity, digital design, telecommunications, and R&D environments. It captures complex waveforms with exceptional speed and precision, enabling engineers to identify intermittent faults and validate system performance efficiently.
– Technical Specifications
Bandwidth and Sampling
• Bandwidth: 1 GHz
• Sample Rate: Up to 4 GS/s
• Waveform Capture Rate: Up to 400,000 wfms/s
• Record Length: Up to 8 M points
• Vertical Resolution: 8-Bit (11-Bit with averaging, 13-Bit with Hi-Res)
Channels and Measurement Accuracy
• Channels: 4
• Vertical Accuracy: 1%
• Vertical Sensitivity: 1 mV to 10 V/div
• Peak Detect: 1 ns
• Differential Measurements: Up to 1 GHz
Physical
• Weight: 25 lbs
• Dimensions: 16 × 14 × 10 in
– Key Features
• InstaVu™ Acquisition enables waveform capture rates over 1000× faster than conventional DSOs, dramatically reducing debugging time for intermittent signals
• 29 automatic measurements with statistics for rapid characterization
• Advanced triggering modes including edge, pulse width, video, glitch, runt, and width
• Channel deskew for precise multi-channel alignment
• FFT and advanced math functions for signal decomposition
• Waveform histograms and limit testing for statistical analysis and pass/fail validation
• Communications signal analysis with mask testing and optical reference receivers (SONET/SDH, Fiber Channel)
– Typical Applications
• Signal integrity and timing analysis in high-speed digital circuits
• Telecommunications protocol validation and eye-diagram measurement
• Power analysis via dedicated application module
• Disk drive and communications pulse characterization
• Debugging complex multi-channel systems
– Compatibility & Integration
• Full GPIB programmability for automated test environments
• RS-232 and Centronics hardcopy interfaces
• WaveStar Software with Advanced DSP Math options
• Floppy and Hard Disk storage for waveform archival and traceability
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