Tektronix TDS8000 Digital Sampling Oscilloscope

The Tektronix TDS8000 is a modular digital sampling oscilloscope engineered for acquisition and analysis of high-speed electrical and optical signals. It delivers 14-bit vertical resolution across a configurable multi-channel architecture supporting up to 8 simultaneous inputs—either 8 electrical channels or a hybrid configuration of 2 optical and 6 electrical channels. The instrument accommodates up to four dual-channel electrical and two single-channel optical sampling modules, with bandwidth and rise time determined by the installed modules. Sample intervals reach as low as 10 femtoseconds, enabling precise characterization of fast transients and high-frequency waveforms in communications, semiconductor development, and data storage applications.

– Technical Specifications

-# Signal Acquisition
• Acquisition modes: Sample (normal), envelope, and average
• Maximum simultaneous channels: 8 (configurable as 8 electrical or 2 optical + 6 electrical)
• Sampling modules supported: Up to four dual-channel electrical and two single-channel optical modules
• Vertical resolution: 14 bits over sampling module dynamic range

-# Horizontal System
• Timebase range: 1 ps/div to 5 ms/div (1-2-5 sequence or 1 ps increments)
• Sample interval: As low as 10 femtoseconds
• Horizontal sensitivity: < 21 ps: 1 ps + 1% of interval; ≥ 21 ps Short-term Optimized Mode: 8 ps + 0.1% of interval; ≥ 21 ps Locked to 10 MHz Mode: 8 ps + 0.01% of interval
• Horizontal deskew range: -500 ps to +100 ns per channel (1 ps increments)
• Record length: 20, 50, 100, 500, 1000, 2000, or 4000 samples
• Magnification views: Two independent views with separate timebase settings

-# Trigger System
• Maximum trigger rate: 200 kHz
• Trigger sources: External direct, external pre-scaled, internal clock, and clock recovery (optical modules)
• External direct trigger sensitivity: 50 mV (DC–4 GHz typical); 100 mV (DC–3 GHz guaranteed)
• Pre-scaled trigger sensitivity: 800 mV (2–3 GHz guaranteed); 600 mV (3–10 GHz guaranteed); 1000 mV (10–12.5 GHz typical)
• Short-term jitter: 1.0 ps + 5 PPM typical; < 1.5 ps + 10 PPM maximum
• 10 MHz reference jitter: 1.6 ps + 0.05 PPM typical; < 2.5 ps + 0.10 PPM maximum
• Trigger level range: ±1.0 V
• Trigger input range: ±1.5 V
• Trigger holdoff: 5 µs to 100 ms (2 ns increments)
• Internal clock: 25 to 200 kHz adjustable

– Key Features

• Femtosecond-class sample intervals for sub-picosecond signal detail
• Dual magnification views enable simultaneous examination of overview and detail waveforms
• Multi-module architecture scales from 2 to 8 channels with mixed electrical and optical inputs
• TDR measurement capability with 80E04 module option

– Typical Applications

• High-speed digital and RF signal characterization
• Optical and electrical signal analysis in telecommunications
• Semiconductor device and circuit validation
• Data storage system performance evaluation
• Transient and jitter measurement in complex systems

– Compatibility & Integration

• Supports both electrical sampling modules (dual-channel) and optical sampling modules (single-channel)
• Accepts external trigger inputs up to ±1.5 V
• Clock recovery from integrated optical sampling modules available