The Tektronix TVS621 is a 2-channel VXI waveform analyzer delivering 250 MHz bandwidth and 1 GS/s real-time sampling in a compact C-size module. Built for high-speed signal acquisition and mixed-signal test applications, it combines oscilloscope functionality with advanced DSP-based analysis—all within a standardized VXI architecture that integrates into automated test systems.
– Technical Specifications
Acquisition Performance
• Bandwidth: 250 MHz
• Maximum sample rate: 1 GS/s (all channels simultaneous)
• Vertical resolution: 8-bits (256 levels)
• Record length: 15k samples standard; 30,000 samples in extended real-time mode
• Sample interval: As short as 200 ps/point
• Channels: 2
Input Characteristics
• Input impedance: Selectable 50 Ω or 1 MΩ
• Input sensitivity: 10 mV to 100 V full scale
• Connectors: BNC
Triggering
• Internal modes: Main, Delayed, Edge, Pulse
• Trigger sources: Input channels, external front-panel trigger, VXI backplane triggers
• Acquisition delay: Time or event-based
Analysis and Processing
• Waveform math
• FFT analysis
• Digital filtering: High-pass, low-pass, band-pass, band-reject
• Waveform template testing
• Measurement limit testing
• Zoned waveform measurements
• Integrated DSP engine
Acquisition Modes
• Auto-Advance, Envelope, Average, Sample, Peak Detect
– Key Features
• C-size, double-wide VXI module architecture
• Real-time digital acquisition technology
• Fully programmable via extensive SCPI command set
• High-speed data transfer with Fast Data Channel
• VXIplug&play framework support (Windows, Windows 95, Windows NT)
• Probe attenuation auto-detection
• Advanced triggering for signal anomaly capture
– Typical Applications
High-speed transient capture, protocol analysis, waveform characterization, and automated measurement and limit testing in production and field test environments.
– Compatibility & Integration
VXIbus-compatible architecture ensures interoperability within existing VXI systems. Message-based interface and SCPI programming enable integration into automated test sequences and custom measurement frameworks.
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