Teledyne LeCroy T3DSO2304 Oscilloscope, 4 Channel, 300 MHz

The Teledyne LeCroy T3DSO2304 is a 4-channel digital oscilloscope delivering 300 MHz analog bandwidth for precision signal acquisition and analysis in laboratory and field environments. This instrument captures complex waveforms at up to 2 GSa/s in interleaved mode, with 12-bit vertical resolution and 1 mV/div to 10 V/div sensitivity across 1 MΩ / 22 pF inputs. The 8-inch TFT-LCD display renders 256-level intensity grading for detailed waveform visualization.

– Technical Specifications

Analog Bandwidth: 300 MHz
Number of Channels: 4
Vertical Resolution: 12-bit
Vertical Sensitivity: 1 mV/div to 10 V/div
Input Impedance: 1 MΩ / 22 pF
Input Coupling: AC, DC, GND
Maximum Sample Rate: 2 GSa/s (interleave mode); 1 GSa/s per channel (all channels enabled); up to 2 GSa/s (single channel per ADC active)
Memory Depth: 140 Mpts per channel (half channel mode); 70 Mpts per channel (all channels enabled); 200 Mpts maximum
Timebase Range: 1 ns/div to 50 s/div
Display: 8-inch TFT-LCD, 800 × 480 pixels
Waveform Capture Rate: 140,000 wfm/s (normal mode); 500,000 wfm/s (sequence mode)
History Recording: Up to 80,000 waveforms

– Key Features

• Edge, slope, pulse width, window, runt, interval, timeout, pattern, and video triggering
• Holdoff range 100 ns to 1.5 s
• Serial bus triggering for IIC, SPI, UART, RS232, CAN, and LIN (optional)
• 37 automatic measurement parameters
• FFT and eight math functions (addition, subtraction, division, multiplication, integration, differentiation, square root)
• Peak detect, average, and ERES enhanced resolution acquisition modes
• Hardware-based pass/fail function
• Sequence mode for extended waveform recording and analysis
• USB host connectivity

– Typical Applications

Design verification, signal integrity analysis, embedded system debugging, transient event capture, and complex waveform characterization across digital, analog, and mixed-signal circuits.

– Compatibility & Integration

USB host interface supports external storage and peripheral connectivity for automated test workflows and data logging.