Wayne Kerr A40100

The Wayne Kerr A40100 is a precision impedance analyzer for accurate measurement of electronic components and materials across a broad frequency spectrum. It delivers basic measurement accuracy of ±0.05% for capacitance, inductance, and impedance, with dissipation factor accuracy of ±0.0005. The instrument measures 11 distinct parameters—impedance, resistance, reactance, phase angle, capacitance, inductance, quality factor, dissipation factor, admittance, conductance, and susceptance—enabling comprehensive characterization in research, development, and quality control workflows.

– Technical Specifications

Measurement Frequency Range: 20 Hz to 3 MHz with 42 selectable frequencies per decade (repeating to 60 kHz, with additional steps to 300 kHz). Frequency accuracy: ±0.01%.

Measurement Parameters & Ranges:
• Impedance (Z), Resistance (R), Reactance (X): 0.01 mΩ to >1 GΩ
• Capacitance (C): 0.01 pF to >1 F
• Inductance (L): 1 nH to >2 kH
• Quality Factor (Q), Dissipation Factor (D): 0.0001 to 9999.9
• Admittance (Y), Conductance (G), Susceptance (B): 0.1 nS to >2 kS
• Phase Angle: −180° to +180°

Accuracy: ±0.05% for Z, R, X, L, C; ±0.0005 for dissipation factor; ±0.05% for quality factor (10°C to 30°C).

Drive Levels: AC drive 1.05 V to 5.0 V (0.05 V or 0.1 V steps) or 1 mA to 100 mA (1 mA or 2 mA steps). Automatic drive mode selection based on impedance range. Selectable down to 1 V or 20 mA.

DC Bias Option: 0 to +40 V dc bias voltage with 0 to +100 mA dc bias current. Optional /D2 module extends voltage range to −40 V to +40 V.

Measurement Speed: Up to 50 measurements per second with four selectable speed modes.

– Key Features

• 7-inch CRT display with microprocessor control and soft-key interface
• Non-volatile memory storage for selected measurement functions and conditions
• Display resolution up to 6 digits (dependent on measurement range)
• Rear panel safety link for DC bias inhibition or external bias supply connection

– Typical Applications

Component characterization, material property analysis, capacitor and inductor testing, impedance measurement across audio, RF, and power frequencies.