The Yokogawa DL700 series is a modular digital oscilloscope platform engineered for precision waveform capture and multi-channel signal analysis. Built on a customizable architecture, the DL716 delivers 16-channel simultaneous measurement capability with up to 10 MS/s sampling and configurable analog/digital modules for isolation, high-resolution, temperature, strain, and logic acquisition. Extended memory options enable long-duration recording—up to 42.6 minutes at 100 kS/s to hard disk or 6.4 seconds at 10 MS/s in RAM—making it suitable for both transient capture and extended monitoring applications.
– Technical Specifications
• Channels: 16 (DL716 model)
• Sampling Rate: Maximum 10 MS/s; 200 kS/s for simultaneous 16-channel operation
• Memory Capacity: 64 M words (4-channel simultaneous); 256 M words (single-channel to disk); 512 MB internal hard disk for 80-second 16-channel recording at 200 kS/s; DL750 expandable to 1 GW (50 MW per channel)
• Recording Duration: 6.4 seconds at 10 MS/s (RAM); 42.6 minutes at 100 kS/s (hard disk)
• Display: 10.4-inch color TFT LCD (DL716); DL750 features SVGA 750 × 512 pixel resolution
• Data Processing: Five Acquisition Data Processors (80,000 logic gates each) for 16-channel measurement; Acquisition Control Logic with 50,000 gates for sequence and memory management
– Key Features
• Up to seven plug-in analog modules supporting isolation, high-speed, high-resolution, temperature, and strain measurements
• Analog module options: 701250 (10 MS/s 12-bit, 3 MHz bandwidth, 0.5% accuracy); 701251 (1 MS/s 16-bit high-resolution, 1 mV/div); 701260 (100 kS/s 16-bit high-voltage isolation); 701265 (temperature/precision voltage); 701270/701271 (strain); 701275 (acceleration/voltage, 2 CH); 701280 (frequency, 2 CH)
• 16-bit digital logic input modules
• Integrated data compression and trigger detection via onboard processing
– Compatibility & Integration
• SCSI, RS-232, and GP-IB communication ports enable direct PC data transfer and analysis
• Hard disk recording supports extended waveform archival and offline analysis
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